Admission test for MBBS in government and private medical colleges of the country is set to take place on March 10
The application process for admission to government and private medical colleges in Bangladesh began on Monday.
It would continue till February 23.
Online application fee can be submitted till 11:59pm on February 24.
Director of Health Education Department (Medical Education) Dr Mujtahid Muhammad Hossain said admission test for MBBS in government and private medical colleges of the country is set to take place on March 10.
The exam will be held from 10am to 11am on that day.
Earlier it was informed in a circular that according to the policy-2023 formulated by Bangladesh Medical and Dental Council for medical admission, application can be made online at the scheduled time. Applicant must be a citizen of Bangladesh.
Students who have obtained GPA 9 collectively in Secondary School Certificate (SSC) and Higher Secondary Certificate (HSC) can apply for admission online.
There are 4,350 seats in 37 government medical colleges and 6,489 seats in 72 private medical colleges.
In 2022, the medical admission test was held on April 1 where 143,000 students participated.
The MarketWatch News Department was not involved in the creation of this content.
Feb 19, 2023 (The Expresswire) -- The “Reengineering Test Management Software market” has witnessed significant growth in recent years, and this trend is expected to continue in the coming years. This market report provides an in-depth analysis of the market's segment by types (Cloud-Based, On-Premise ) and country-wise market sizes. The report considers both qualitative and quantitative aspects of the industry, making it an excellent resource for businesses looking to invest in the market. The report also includes a comprehensive analysis of the market's driving factors and challenges, which will determine its future growth. In addition, stakeholders can identify investment opportunities in micro markets and gain insights into the competitive landscape and the offerings of key players.
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Reengineering Test Management System help companies streamline testing procedures which are already in place by providing them a set of advanced functionalities for planning and executing test cases, implementing testing scripts, reporting on their results, and much more. They are considered to be the most flexible systems of this kind where you can include your business rules and work in accordance with them. Market Analysis and Insights: Global Keyword Market The global Keyword market size is projected to reach USD million by 2026, from USD million in 2019, at a CAGR of percent during 2021-2026.
Get a demo PDF of the Report 2023
Report Scope
This latest report researches the industry structure, sales, revenue, price and gross margin. Major producers' production locations, market shares, industry ranking and profiles are presented. The primary and secondary research is done in order to access up-to-date government regulations, market information and industry data. Data were collected from the Reengineering Test Management Software manufacturers, distributors, end users, industry associations, governments' industry bureaus, industry publications, industry experts, third party database, and our in-house databases.
Key Companies Covered
In this section of the report, the researchers have done a comprehensive analysis of the prominent players operating and the strategies they are focusing on to combat the intense competition. Company profiles and market share analysis of the prominent players are also provided in this section. Additionally, the certified have done an all-encompassing analysis of each player. They have also provided reliable sales, revenue, price, market share and rank data of the manufacturers.
Some of the players in the research report include:
● StickyMinds ● Infopulse ● Paradigm Infotech ● PractiTest ● HPE ALM ● HP ● ReQtest ● SoapUI ● Sauce Labs ● Applause ● WebLOAD ● Apache Jmeter ● test IO ● OmniconvertInquire or Share Your Questions If Any Before the Purchasing This Report - https://www.marketresearchguru.com/enquiry/pre-order-enquiry/17293248
Reengineering Test Management Software segment by Type:
● Cloud-Based ● On-PremiseReengineering Test Management Software segment by Application:
● Large Enterprise ● SMBsKey Regions and Countries
This section of the report provides key insights regarding various regions and the key players operating in each region. Economic, social, environmental, technological, and political factors have been taken into consideration while assessing the growth of the particular region/country. The readers will also get their hands on the value and sales data of each region and country for the period 2017-2026.
● North America ● United States ● Canada ● Europe ● Germany ● FranceTo Understand How Covid-19 Impact Is Covered in This Report -https://marketresearchguru.com/enquiry/request-covid19/17293248
COVID-19 and Russia-Ukraine War Influence Analysis
The readers in the section will understand how the Reengineering Test Management Software market scenario changed across the globe during the pandemic, post-pandemic and Russia-Ukraine War. The study is done keeping in view the changes in aspects such as demand, consumption, transportation, consumer behavior, supply chain management, export and import, and production. The industry experts have also highlighted the key factors that will help create opportunities for players and stabilize the overall industry in the years to come.
Reasons to Buy This Report
This report will help the readers to understand the competition within the industries and strategies for the competitive environment to enhance the potential profit. The report also focuses on the competitive landscape of the global Reengineering Test Management Software market, and introduces in detail the market share, industry ranking, competitor ecosystem, market performance, new product development, operation situation, expansion, and acquisition. etc. of the main players, which helps the readers to identify the main competitors and deeply understand the competition pattern of the market.
This report will help stakeholders to understand the global industry status and trends of Reengineering Test Management Software and provides them with information on key market drivers, restraints, challenges, and opportunities.
This report will help stakeholders to understand competitors better and gain more insights to strengthen their position in their businesses. The competitive landscape section includes the market share and rank (in volume and value), competitor ecosystem, new product development, expansion, and acquisition.
This report stays updated with novel technology integration, features, and the latest developments in the market
This report helps stakeholders to understand the COVID-19 and Russia-Ukraine War Influence on the Reengineering Test Management Software industry.
This report helps stakeholders to gain insights into which regions to target globally
This report helps stakeholders to gain insights into the end-user perception concerning the adoption of Reengineering Test Management Software.
This report helps stakeholders to identify some of the key players in the market and understand their valuable contribution.
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Chapters included in this report:
● Chapter 1: Introduces the report scope of the report, executive summary of different market segments (by region, product type, application, etc), including the market size of each market segment, future development potential, and so on. It offers a high-level view of the current state of the market and its likely evolution in the short to mid-term, and long term. ● Chapter 2: Detailed analysis of Reengineering Test Management Software manufacturers competitive landscape, price, output and revenue market share, latest development plan, merger, and acquisition information, etc. ● Chapter 3: Production/output, value of Reengineering Test Management Software by region/country. It provides a quantitative analysis of the market size and development potential of each region in the next six years. ● Chapter 4: Consumption of Reengineering Test Management Software in regional level and country level. It provides a quantitative analysis of the market size and development potential of each region and its main countries and introduces the market development, future development prospects, market space, and capacity of each country in the world. ● Chapter 5: Provides the analysis of various market segments according to product type, covering the market size and development potential of each market segment, to help readers find the blue ocean market in different market segments. ● Chapter 6: Provides the analysis of various market segments according to application, covering the market size and development potential of each market segment, to help readers find the blue ocean market in different downstream markets. ● Chapter 7: Provides profiles of key players, introducing the basic situation of the main companies in the market in detail, including product production/output, revenue, , price, gross margin, product introduction, recent development, etc. ● Chapter 8: Analysis of industrial chain, including the upstream and downstream of the industry. ● Chapter 9: Analysis of sales channel, distributors and customers ● Chapter 10: Introduces the market dynamics, latest developments of the market, the driving factors and restrictive factors of the market, the challenges and risks faced by manufacturers in the industry, and the analysis of relevant policies in the industry.More.
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Detailed TOC of Global Reengineering Test Management Software Market Report, History and Forecast 2015-2026, Breakdown Data by Companies, Key Regions, Types and Application
1 Market Overview of Reengineering Test Management Software
1.1 Reengineering Test Management Software Market Overview
1.1.1 Reengineering Test Management Software Product Scope
1.1.2 Market Status and Outlook
1.2 Global Reengineering Test Management Software Market Size Overview by Region 2015 VS 2020 VS 2026
1.3 Global Reengineering Test Management Software Market Size by Region (2015-2026)
1.4 Global Reengineering Test Management Software Historic Market Size by Region (2015-2020)
1.5 Global Reengineering Test Management Software Market Size Forecast by Region (2021-2026)
1.6 Key Regions, Reengineering Test Management Software Market Size YoY Growth (2015-2026)
1.6.1 North America Reengineering Test Management Software Market Size YoY Growth (2015-2026)
1.6.2 Europe Reengineering Test Management Software Market Size YoY Growth (2015-2026)
1.6.3 Asia-Pacific Reengineering Test Management Software Market Size YoY Growth (2015-2026)
1.6.4 Latin America Reengineering Test Management Software Market Size YoY Growth (2015-2026)
1.6.5 Middle East and Africa Reengineering Test Management Software Market Size YoY Growth (2015-2026)
2 Reengineering Test Management Software Market Overview by Type
2.1 Global Reengineering Test Management Software Market Size by Type: 2015 VS 2020 VS 2026
2.2 Global Reengineering Test Management Software Historic Market Size by Type (2015-2020)
2.3 Global Reengineering Test Management Software Forecasted Market Size by Type (2021-2026)
3 Reengineering Test Management Software Market Overview by Application
3.1 Global Reengineering Test Management Software Market Size by Application: 2015 VS 2020 VS 2026
3.2 Global Reengineering Test Management Software Historic Market Size by Application (2015-2020)
3.3 Global Reengineering Test Management Software Forecasted Market Size by Application (2021-2026)
4 Global Reengineering Test Management Software Competition Analysis by Players
4.1 Global Reengineering Test Management Software Market Size (Million US$) by Players (2015-2020)
4.2 Global Top Manufacturers by Company Type (Tier 1, Tier 2 and Tier 3) (based on the Revenue in Reengineering Test Management Software as of 2019)
4.3 Date of Key Manufacturers Enter into Reengineering Test Management Software Market
4.4 Global Top Players Reengineering Test Management Software Headquarters and Area Served
4.5 Key Players Reengineering Test Management Software Product Solution and Service
4.6 Competitive Status
4.6.1 Reengineering Test Management Software Market Concentration Rate
4.6.2 Mergers and Acquisitions, Expansion Plans
5 Company (Top Players) Profiles and Key Data
6 North America
6.1 North America Reengineering Test Management Software Market Size by Country
6.2 United States
6.3 Canada
7 Europe
7.1 Europe Reengineering Test Management Software Market Size by Country
7.2 Germany
7.3 France
7.4 U.K.
7.5 Italy
7.6 Russia
7.7 Nordic
7.8 Rest of Europe
8 Asia-Pacific
8.1 Asia-Pacific Reengineering Test Management Software Market Size by Region
8.2 China
8.3 Japan
8.4 South Korea
8.5 Southeast Asia
8.6 India
8.7 Australia
8.8 Rest of Asia-Pacific
9 Latin America
9.1 Latin America Reengineering Test Management Software Market Size by Country
9.2 Mexico
9.3 Brazil
9.4 Rest of Latin America
10 Middle East and Africa
10.1 Middle East and Africa Reengineering Test Management Software Market Size by Country
10.2 Turkey
10.3 Saudi Arabia
10.4 UAE
10.5 Rest of Middle East and Africa
11 Reengineering Test Management Software Market Dynamics
11.1 Industry Trends
11.2 Market Drivers
11.3 Market Challenges
11.4 Market Restraints
12 Research Finding /Conclusion
13 Methodology and Data Source
13.1 Methodology/Research Approach
13.1.1 Research Programs/Design
13.1.2 Market Size Estimation
13.1.3 Market Breakdown and Data Triangulation
13.2 Data Source
13.2.1 Secondary Sources
13.2.2 Primary Sources
13.3 Disclaimer
13.4 Author List
For Detailed TOC - https://marketresearchguru.com/TOC/17293248#TOC
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To view the original version on The Express Wire visit Advancement in Reengineering Test Management Software Market with Respect to Upcoming Challenges by 2026
COMTEX_424828751/2598/2023-02-19T11:56:38
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The MarketWatch News Department was not involved in the creation of this content.
Feb 19, 2023 (The Expresswire) -- "Final Report will add the analysis of the impact of COVID-19 on this industry."
“Wireless Communication Test Set Market” research is a crucial component of any successful business strategy. It provides valuable insights into consumer behaviors, preferences, and trends, helping companies make informed decisions about product development, marketing, and overall business strategy. Effective market research requires a well-designed research plan, a comprehensive understanding of the target market, and the use of appropriate research methodologies and tools. Whether it is through primary research, such as surveys and focus groups, or secondary research, such as industry reports and competitor analysis, market research helps companies stay ahead of the competition and respond to the evolving needs of their target market. By continuously monitoring the Wireless Communication Test Set market and gathering information on consumer attitudes and behaviors, companies can make data-driven decisions that drive growth and long-term success.
Get a demo PDF of the Report - https://www.industryresearch.co/enquiry/request-sample/22502515
Wireless communications test sets are essentiallyÂone-box integrated vector signal analyzers and vector signal generators that deliver quick, repeatable measurements, which translate to lower costs and enahnced profit margins for companies seeking to diagnose their wireless connections.
newest research report, the âWireless Communication Test Set Industry Forecastâ looks at past sales and reviews total world Wireless Communication Test Set sales in 2022, providing a comprehensive analysis by region and market sector of projected Wireless Communication Test Set sales for 2023 through 2029. With Wireless Communication Test Set sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in USD millions of the world Wireless Communication Test Set industry.
This Insight Report provides a comprehensive analysis of the global Wireless Communication Test Set landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and MandA activity. This report also analyzes the strategies of leading global companies with a focus on Wireless Communication Test Set portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms' unique position in an accelerating global Wireless Communication Test Set market.
This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for Wireless Communication Test Set and breaks down the forecast by type, by application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global Wireless Communication Test Set.
The global Wireless Communication Test Set market size is projected to grow from USD million in 2022 to USD million in 2029; it is expected to grow at a CAGR of percent from 2023 to 2029.
As the global economy mends, the growth of Wireless Communication Test Set will have significant change from previous year. The global Wireless Communication Test Set market size will reach significant USD in 2028, growing at a CAGR over the analysis period.
The Wireless Communication Test Set Market report also splits the market by region: Americas, United States, Canada, Mexico, Brazil, APAC, China, Japan, Korea, Southeast Asia, India, Australia, Europe, Germany, France, UK, Italy, Russia, Middle East and Africa, Egypt, South Africa, Israel, Turkey, GCC Countries.
To Understand How Covid-19 Impact Is Covered in This Report -https://www.industryresearch.co/enquiry/request-covid19/22502515
Wireless Communication Test Set Market Segment by Manufacturers, this report covers:
● Teradyne
● Advantest
● Rohde and Schwarz
● Cohu
● Keysight Technologies
● Anritsu Corporation
● Fortive
● Danaher
● Yokogawa Electric Corporation
● Chroma Group
● SPEA
● LTX-Credence
● National Instruments
● Averna
● Credence Systems Corporation
● Astronics Corporation
● Textron
● VIAVI
● Cobham
● Roos Instruments
● Tescom
● NetScout Systems
● EXFO
● LitePoint
● Beijing StarPoint Technology
Segmentation by type and application:
Segmentation by type
- Portable
- Desktop
Segmentation by application
- Telecom
- Industrial
- Military and Aerospace
- Others
Get a demo Copy of the Wireless Communication Test Set market Report 2022
Key Reasons to Purchase:
● To gain insightful analyses of the market and have a comprehensive understanding of the global market and its commercial landscape. ● Assess the production processes, major issues, and solutions to mitigate the development risk. ● To understand the most affecting driving and restraining forces in the Wireless Communication Test Set market and its impact in the global market. ● Learn about the market strategies that are being adopted by leading respective organizations. ● To understand the outlook and prospects for the market.Purchase this Report (Price 3660 USD for a Single-User License) -https://www.industryresearch.co/purchase/22502515
Detailed TOC of Global Wireless Communication Test Set Market Growth 2023-2029
1 Scope of the Report
1.1 Market Introduction
1.2 Years Considered
1.3 Research Objectives
1.4 Market Research Methodology
1.5 Research Process and Data Source
1.6 Economic Indicators
1.7 Currency Considered
1.8 Market Estimation Caveats
2 Executive Summary
2.1 World Market Overview
2.2 Wireless Communication Test Set Segment by Type
2.3 Wireless Communication Test Set Sales by Type
2.4 Wireless Communication Test Set Segment by Application
2.5 Wireless Communication Test Set Sales by Application
3 Global Wireless Communication Test Set by Company
3.1 Global Wireless Communication Test Set Breakdown Data by Company
3.2 Global Wireless Communication Test Set Annual Revenue by Company (2018-2023)
3.3 Global Wireless Communication Test Set Sale Price by Company
3.4 Key Manufacturers Wireless Communication Test Set Producing Area Distribution, Sales Area, Product Type
3.5 Market Concentration Rate Analysis
3.6 New Products and Potential Entrants
3.7 Mergers and Acquisitions, Expansion
4 World Historic Review for Wireless Communication Test Set by Geographic Region
4.1 World Historic Wireless Communication Test Set Market Size by Geographic Region (2018-2023)
4.2 World Historic Wireless Communication Test Set Market Size by Country/Region (2018-2023)
4.3 Americas Wireless Communication Test Set Sales Growth
4.4 APAC Wireless Communication Test Set Sales Growth
4.5 Europe Wireless Communication Test Set Sales Growth
4.6 Middle East and Africa Wireless Communication Test Set Sales Growth
5 Americas
5.1 Americas Wireless Communication Test Set Sales by Country
5.2 Americas Wireless Communication Test Set Sales by Type
5.3 Americas Wireless Communication Test Set Sales by Application
5.4 United States
5.5 Canada
5.6 Mexico
5.7 Brazil
6 APAC
6.1 APAC Wireless Communication Test Set Sales by Region
6.2 APAC Wireless Communication Test Set Sales by Type
6.3 APAC Wireless Communication Test Set Sales by Application
6.4 China
6.5 Japan
6.6 South Korea
6.7 Southeast Asia
6.8 India
6.9 Australia
6.10 China Taiwan
7 Europe
7.1 Europe Wireless Communication Test Set by Country
7.2 Europe Wireless Communication Test Set Sales by Type
7.3 Europe Wireless Communication Test Set Sales by Application
7.4 Germany
7.5 France
7.6 UK
7.7 Italy
7.8 Russia
8 Middle East and Africa
8.1 Middle East and Africa Wireless Communication Test Set by Country
8.2 Middle East and Africa Wireless Communication Test Set Sales by Type
8.3 Middle East and Africa Wireless Communication Test Set Sales by Application
8.4 Egypt
8.5 South Africa
8.6 Israel
8.7 Turkey
8.8 GCC Countries
9 Market Drivers, Challenges and Trends
9.1 Market Drivers and Growth Opportunities
9.2 Market Challenges and Risks
9.3 Industry Trends
10 Manufacturing Cost Structure Analysis
10.1 Raw Material and Suppliers
10.2 Manufacturing Cost Structure Analysis of Wireless Communication Test Set
10.3 Manufacturing Process Analysis of Wireless Communication Test Set
10.4 Industry Chain Structure of Wireless Communication Test Set
11 Marketing, Distributors and Customer
12 World Forecast Review for Wireless Communication Test Set by Geographic Region
12.1 Global Wireless Communication Test Set Market Size Forecast by Region
12.2 Americas Forecast by Country
12.3 APAC Forecast by Region
12.4 Europe Forecast by Country
12.5 Middle East and Africa Forecast by Country
13 Key Players Analysis
14 Research Findings and Conclusion
For Detailed TOC -https://www.industryresearch.co/TOC/22502515#TOC
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Bluetooth Headsets for Phone Call Market
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To view the original version on The Express Wire visit Wireless Communication Test Set Market: Exploration of the Top Regions and Players with Opportunities
COMTEX_424819058/2598/2023-02-19T07:29:15
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The syphilis testing market is expected to witness a steady growth in the future. The market has drawn the interest of the healthcare industry.
PORTLAND, OREGON, UNITED STATES, February 10, 2023 /einpresswire.com / -- Syphilis is a sexually transmitted infection caused by the bacterium Treponema pallidum. 'syphilis testing market by By Type (Primary & Secondary Syphilis, Others), by Location of Testing (Laboratory testing, Point of care (POC) testing): Global Opportunity Analysis and Industry Forecast, 2020-2030.' According to the report, the global syphilis testing industry was pegged at $1.1 billion in 2020, and is expected to reach $1.9 billion by 2030, growing at a CAGR of 5.6% from 2021 to 2030.
Syphilis can be detected through various laboratory tests, including:
1.Rapid plasma reagin (RPR) test: This is a blood test that screens for the presence of antibodies to Treponema pallidum.
2.Venereal Disease Research Laboratory (VDRL) test: This is a blood test that screens for the presence of antibodies to Treponema pallidum.
3.Fluorescent Treponemal Antibody-Absorption (FTA-Abs) test: This is a blood test that confirms the presence of Treponema pallidum infection by detecting antibodies specific to the bacterium.
4.Treponema pallidum particle agglutination (TP-PA) test: This is a blood test that confirms the presence of Treponema pallidum infection by detecting antibodies specific to the bacterium.
5.Polymerase chain reaction (PCR) test: This is a test that can detect the DNA of Treponema pallidum in a demo of fluid or tissue.
6.Darkfield microscopy: This is a test that can visualize Treponema pallidum in a demo of fluid or tissue using a special type of microscope.
♦ download Free demo PDF Of This Report:
The increase in sexually transmitted diseases including syphilis and advances in technology are driving the growth of the syphilis test market. However, the high health and economic burden in developing countries due to syphilis and the avoidance and restriction of voluntary testing/CICT for syphilis prevent the adoption of screening tests or mass testing, thus -restrict the growth of the syphilis testing market.
Major market players covered in the report, such as -
Becton Dickinson And Company
Hologic, Inc.
Cepheid Inc.
DiaSorin
Abbott Laboratories
Bio-Rad Laboratories
Beckman Coulter Inc
F. Hoffmann-La Roche
Affymetrix, Inc
Siemens healthcare
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Key Benefits for Stakeholders -
. The report provides quantitative analysis of market segments, current trends, strategies and potential of Syphilis Testing Market research to identify potential Syphilis Testing Market opportunities in genetics.
. In-depth analysis of this sector helps identify current market opportunities.
. Market analysis and information related to key drivers, restraints and opportunities are provided. . Porter's Five Forces Analysis identifies the capabilities of buyers and suppliers to enable stakeholders to make profitable business decisions and strengthen the network of buyers.
. The largest countries in each region are listed according to their contribution to the global market.
. Focusing on market players makes benchmarking easier and provides a clear understanding of the current market situation.
. The report includes regional and global Syphilis Testing Market analysis, key players, market segments, application areas and Market growth strategies.
The key factors that propel the market growth include, increase in prevalence of sexually transmitted diseases, increase in awareness about the disease, and rise in geriatric population across the globe. In addition, the emergence of novel syphilis testing techniques for treatment with fewer side effects is expected to boost the market growth. Moreover, technological advancement and initiatives taken by government and private organizations to develop the pharmaceutical industry propel the growth of the syphilis testing market. However, side effects of the syphilis treatment, such as fever, headache, muscle pain. And others are expected to restrict the market growth during the forecast period.
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The Syphilis Testing Market is expected to witness a significant growth in the coming years. This market has gained interest of the healthcare and medical sectors owing to increased prevalence of hypertension throughout the globe. Furthermore, the global Syphilis Testing Market is segmented on the basis of product type, end user, and region. leading market players have been introducing various strategies to help enterprises move their on-premise models to on-demand models.
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The admission test will take place on March 10
The application process for admission to government and private medical colleges in Bangladesh will start from Sunday.
Students who have obtained GPA 9 collectively in Secondary School Certificate (SSC) and Higher Secondary Certificate (HSC) can apply for admission online.
The admission process will remain as before and the number of seats will also remain the same.
Dr Abul Bashar Md Jamal, additional director general (Medical Education) of the Directorate General of Medical Education (DGME) on Wednesday said that the notice for the medical admission test will be published on Friday or Saturday.
Admission test for MBBS in government and private medical colleges of the country is set to take place on March 10.
The exam will be held from 10am to 11am on that day.
There are 4,350 seats in 37 government medical colleges and 6,489 seats in 72 private medical colleges.
In 2022, the medical admission test was held on April 1 where 143,000 thousand students participated.
The semiconductor industry is urgently pursuing design, monitoring, and testing strategies to help identify and eliminate hardware defects that can cause catastrophic errors.
Corrupt execution errors, also known as silent data errors, cannot be fully isolated at test — even with system-level testing — because they occur only under specific conditions. To sort out the environmental conditions that produce errors, engineers need data internal to SoCs that ideally is time-stamped so they can trace it back to the failing lines of code. But that time-stamped data isn’t available yet, and it will take time to provide that capability. In the meantime, pressure is building inside large data centers to solve this problem — particularly among the hyperscalers that have encountered these issues.
The data center computational errors that Google and Meta engineers reported in 2021 have raised concerns regarding an unexpected cause — manufacturing defect levels on the order of 1,000 DPPM. Specific to a single core in a multi-core SoC, these hardware defects are difficult to isolate during data center operations and manufacturing test processes. In fact, SDEs can go undetected for months because the precise inputs and local environmental conditions (temperature, noise, voltage, clock frequency) have not yet been applied.
For instance, Google engineers noted ‘an innocuous change to a low-level library’ started to provide wrong answers for a massive-scale data analysis pipeline. They went on to write, “Deeper investigation revealed that these instructions malfunctioned due to manufacturing defects, in a way that could only be detected by checking the results of these instructions against the expected results; these are ‘silent’ corrupt execution errors, or CEEs.” [1]
However, once evident, data center operators can quantify the impact to their operations, such as a data center’s reliability and availability. Google listed the computational impact of CEEs in increasing order of risk as:
- Wrong answers that are detected nearly immediately, through self-checking, exceptions, or segmentation faults, which might allow automated retries.
- Machine checks, which are more disruptive.
- Wrong answers that are detected, but only after it is too late to retry the computation.
- Wrong answers that are never detected.
All four possibilities have impacted data center operations, as both Google and Meta engineering teams noted in 202. [1, 2] The first two issues, while troublesome, may be recoverable. The second two are not recoverable because the incorrect computation has been passed on to a subsequent piece of code, which eventually disrupts system operation.
Each randomly occurring manufacturing defect maps only to specific calculations and data inputs. The SDE’s low repeatability indicates that environmental conditions play role. Due to an SDE’s specificity, finding these hardware defects is extremely challenging. It requires a concerted effort over time, which Google characterizes as “many engineer-decades.”
Industry experts have concluded that data internal to the failing core could provide insight and potentially lead to improved screening procedures during chip manufacturing. At advanced CMOS process nodes, in particular, SoCs bound for data center applications are more vulnerable to interactions between system operation conditions and the challenges of fabricating tiny devices, interconnects and vias.
“At a high level, SDE issues are very subtle in nature,” said Steve Pateras vice president of marketing and business development at Synopsys. “They’re not hard faults. So having a more stringent test is not going to necessarily solve this problem. I don’t think these are things you can find in a testing environment where it is about playing with more patterns. You’re going to find that it’s a result of an environmental set of conditions, whether it’s the environment in which the system finds itself, or whether it’s a certain level of compute processing that is creating stress on the system. We need something beyond test and DFT — beyond manufacturing test in my view.”
Others agree. “The SDE problem space is growing faster than our ability to solve it. They are not easy to trace at the hardware level and manage to propagate all the way through the stack to the application level — either crashing or disrupting the system operation,” said Walter Abramsohn, director of product marketing at proteanTecs. “We need new telemetry sources that can monitor these devices in the field and predictively raise a flag before SDE occurs. Aging and degradation must be accounted for when maintaining IT infrastructure. This is the only way we can scale our compute resources reliably.”
Telemetry sources are on-die circuit monitors that provide internal data on environmental conditions, circuit performance, and even specific functional block operations. This data may be insightful, which is one premise of silicon lifecycle management (SLM) infrastructure. Engineers wanting to access longitudinal data on circuit and functional performance must link on-die monitors data from manufacturing test to first system power-up, and all the way through end of life.
Based on high-level observations, it’s possible that workloads in neighboring cores can influence the SDE repeatability. Due to the lengthy time needed before a complex SoC exhibits an SDE, some surmise that degradation due to accelerated aging is a potential cause. However, without more internal data tied to actually system workload data and tracking of device degradation, these causes are pure speculation.
You don’t know what you don’t know
What’s consistent about the Meta and Google engineering teams’ reports is they lack additional data about what’s going on in the circuits during these failures.
“At one of the workshops I attended on this topic, I listened to a Google engineer explain their analysis,” said Adam Cron, distinguished architect at Synopsys. “I asked if they had any silicon lifecycle management data to go with the ‘time of issue.’ The answer: They had no such data. Maybe there is a hot temperature issue. They don’t even know. And Meta engineers have stated they don’t even have logic BiST to apply. I’m not saying logic BiST is a solution. But at least it gives you some sense that the same thing that could have passed on the tester still does, in fact, pass in the system.”
Engineers at Google further confirmed their need for internal data, “Our understanding of CEE impacts is primarily empirical. We have observations of the form, ‘This code has miscomputed (or crashed) on that core.’ We can control what code runs on what cores, and we partially control operating conditions (frequency, voltage, temperature). From this, we can identify some mercurial cores. But because we have limited knowledge of the detailed underlying hardware, and no access to the hardware-supported test structures available to chip makers, we cannot infer much about root causes.” [1]
Detection is indeed vital, but without information for diagnosis little can be done to Strengthen manufacturing screening solutions or respond appropriately with a resilient design solution.
“A very important distinction to be made is first detecting these problems in the system, but also — more important — is diagnosing them.” said Synopsys’ Pateras. “This is where silicon lifecycle management comes in, because now if you’re monitoring all the various environmental conditions, PVT, path delays, and you’re doing this on a regular basis, you can see what was going on in that system when a particular failure occurred. And then you’re getting data to help you diagnose based on information like if there was a temperature spike or a voltage spike at the time of the failure.”
In other words, the internally collected data needs to be time stamped to connect it to the execution of 60 lines of code.
Understanding conditions to Strengthen screening
To fully comprehend what’s happening in the field requires on-die data about design margin, environmental conditions, and functional level operation at or near the time of failure. Such data then can guide both manufacturing screens and future circuit and architectural design choices.
The conditions of failure are sometimes counterintuitive. Consider clock frequency, for example.
In their paper, Google engineers noted, “Temperature, frequency, and voltage all play roles, but their impact varies: e.g., some mercurial core CEE rates are strongly frequency-sensitive, some aren’t. Dynamic Frequency and Voltage Scaling (DFVS) causes frequency and voltage to be closely related in complex ways, one of several reasons why lower frequency sometimes (surprisingly) increases the failure rate.”
An increase in failure rate with lower frequency corresponds with observations from others. In a 2014 paper, Intel engineers wrote that some CPUs (22nm and 14nm) exhibited failures at lower frequencies.
More recently, an industry source shared that their analysis of 5nm HPC RMAs determined that a majority of these chips failed standard production at-speed scan tests when executed at lower clock frequencies.
These observations point to the complex relation between clock frequency and functional path delay margin. In the presence a defect, certain temperature, voltage conditions, and a lower clock frequency, a specific calculation can produce the wrong answer. Such scenarios suggest that changing the clock frequency outside of the DFVS-constrained envelope could alleviate the failing behavior.
“The clocks are a lot more adjustable and controllable in these products,” said Dave Armstrong, principal test strategist at Advantest America. “One of the questions that might provide us a clue is, ‘How many VCOs are there on a design?’ From my recent experience, there are multiple time domains. And there’s tracking between the time domains and noise triggers on those time domains. That’s an area that could allow us some adjustability to provide more margin. Again, there are certain triggers that might occur based on the SDE system-level data we’re seeing.”
Indeed, the triggers can be difficult to decipher without additional knowledge about the hardware and the internal chip data.
On-die monitor data during system operation
The electrical and thermal environment for a device differs between ATE and an end customer’s system. In the mid 1990s, in response to customer returns, CPU suppliers started using system-level test (SLT) as an additional screen.
“The faults that can cause SDE fall in to three main categories — test escapes, latent faults that are not present at test but manifest once the part is in the field, and faults that occur in the field due to wear-out or damage,” said Peter Reichert, system-level test system architect at Teradyne. “SLT test can help with test escapes in that it provides two advantages over traditional test. The first advantage is that functional test is a good way, possibly the best way, to find path delay faults. The second advantage is the low cost of an SLT test insertion allows for longer test times at reasonable cost, thus providing greater fault coverage.”
Almost all empirical evidence about SDEs points to path delay-related failures. Functional test has been part of the engineer’s arsenal of test content at both ATE and SLT. With longer test times, system-level test can cover more functional paths. But with about 1 hour of manufacturing test time, it’s simply impossible to replicate the system workloads that hyperscaler data center operators execute. Thus, an alternative to testing all possible failing paths is to measure path delay margin in the field.
Path delay monitors measure the timing relationship between signal paths and clocks into latches. And such measurements could identify anomalous behavior contributing to an SDE.
“The path delay monitor itself is a very small IP. So in a typical design, you can have hundreds if not thousands of them spread across a die,” said Firooz Massoudi, solutions architect at Synopsys. “They’re all connected through a scan chain to the central controller. The monitor connects to the real functional paths, especially critical paths. It continuously monitors the timing margin available on those paths under different temperature and voltage conditions. Also, you can set triggers, i.e., thresholds. So if the margin of an individual path drops below the threshold, the monitor sends a signal to the central controller. Putting this in combination of voltage and temperature monitors plus ring oscillators gives a holistic view of where the silicon is at any one time. When a monitor detects a failure, you have a profile of the silicon data that really helps to analyze what is happening.”
Currently the monitors and the associated embedded analytics are tied through a central controller and can be observed during manufacturing test and in-field usage. And this data can be used in conjunction with on-die BiST.
“Built-in self-test (BiST) and embedded analytics structures are important because they open up opportunities to gain a more sophisticated view of how the chip is functioning,” said Richard Oxland, product manager for Tessent Embedded Analytics at Siemens EDA. “At a system level, they provide the kind of data that can be used to build a signature of normal system operation. You can configure the on-chip monitors at run time to measure what matters and use the device’s own processing power to build the signature — an edge-based use case. And you can pull the data off-chip and do a cloud-based analysis of the behavior of a fleet of chips.”
In fact, feeding back cloud-based analysis to Strengthen manufacturing test is an emerging application.
“Advantest Cloud Solutions (ACS), when used in combination with embedded sensors in chip design (IP provided by multiple partners), provides comprehensive insights for root cause analysis of silent data corruption (SDC) issues,” said Keith Schaub, vice president, technology and strategy at Advantest America. “Embedded sensors enable the collection and monitoring of health data across the entire chip area throughout the device’s test lifecycle, as well as field use. This data then can be fused together in the cloud and analyzed to detect and isolate the sources of SDC. Additionally, this cloud-based service can be used to automatically generate test patterns or screens, which can further aid in proactively identifying and resolving SDC issues. With the ability to collect, integrate, and analyze data from multiple sources throughout the device’s life cycle, engineers greatly enhance their understanding, and thus, resolution of SDC issues in a continuous and proactive manner.”
Fleet behavior from manufacturing telemetry data already is being used. While in-field data collection is now possible, the telemetry data is independent of system failures. Meta and Google observed SDE failures that occur for specific calculations. To connect telemetry data to such system failures that are detected hours/days/weeks after it occurs requires two things — timestamps of the telemetry data, and logging of telemetry data by data center operators to enable correlation when SDEs are detected.
Several companies are working toward this SLM capability. “Right now, this is not implemented, but that’s one of the features that we’ll be enabling — specifically adding a timestamp to monitor measurements as they are sent to the controller,” said Synopsys’ Massoudi.
As noted earlier, there are multiple on-die monitors that can add context to SDE failures. Their implementation into large SoCs need to be approached in a systematic manner while addressing the feasibility of managing the data they generate. “When it comes to SDEs, test alone is not enough,” said Oxland. “We need a secondary methodology, comprising of five further elements:
- Some a priori knowledge of the manifestation of SDEs in ‘system performance’ parameters that can be measured, because we need to instrument the chip to detect;
- Forensic data recording, including multiple data sources, because any anomaly we detect will need to be attributed to a silicon or software fault;
- Automatic detection of anomalies using baseline data from BiST and embedded analytics’
- Automatic triggering of detailed forensic data dump, because we don’t want to sift through unmanageable volumes of data, and
- The ability to run test patterns on DFT structures in a deployment environment, because we need a cost-effective way to zero in on the cause once the SDE has been detected.”
Detecting latent defects and premature aging in the field
It may be months before an SDE manifests in a core. This leads to speculation that an interconnect path or a transistor has degraded during that time. However, it takes very specific data and instructions to excite an SDE failure, which also can take months to occur. And without additional data, the evidence that some SDEs are due to reliability causes remains inconclusive.
What do the IC suppliers know? “We judge that the risk of SDE for reliability or intrinsic degradation to be low,” said David Lerner, senior principal product quality engineering at Intel. “This is due to our pre-production qualification methods, which characterize all wear-out and degradation modes to provide confidence that every part has sufficient margin for the lifetime of the part.”
Yet for data center operation at nearly 24/7, and shrinking MOS devices on their SoCs, engineers wonder if early wear-out is at least partially to blame. This could be due to a marginal defect or switching a transistor more frequently than the reliability engineers modeled.
The classic bathtub curve used by semiconductor reliability engineers shows the classical three stages of early-life failures, failures during the lifetime and end of life failures.
Fig. 1: Semiconductor device bathtub curve. Source: Ansys
But other factors can accelerate these failures, resulting in increased resistance along the interconnect or degradation in transistor switching time, which in turn can cause increased path delay. Interconnect thinning, due to a combination of electromigration and defects, can increase resistance over time. Reliability engineers use various stress tests to precipitate failures. The failures mechanisms all related to oxide degradation — as hot carrier injection (HCI), negative-bias temperature instability (NBTI), and time-dependent dielectric breakdown (TDDB).
Understanding the cause of these effects is important for the lifecycle of devices, but they won’t solve the problem with silent data errors. “Finding an issue with aging is not going to help with random defects that were missed in testing,” said Andrzej Strojwas, CTO at PDF Solutions. “Now, at very specific locations, things may be happening because it was compromised at the start by having the random defects that narrowed the interconnect path.”
While reliability engineers work with the production test engineering team to screen early life failures, a.k.a. latent defects, at time zero in manufacturing test, better screening could help to some extent, according to Intel’s Lerner. But they won’t catch everything.
“There is a fraction of latent defects that can be accelerated through manufacturing stress and screened. This fraction maybe increased through increases in test coverage and application of a more aggressive stress,” Lerner said. “However, there are limitations, and latent defects that may cause SDE cannot be eliminated by manufacturing, necessitating in-field mitigations.”
Without in-field data over the usage of the part it’s difficult to determine if the failures that took months to appear at Meta and Google are caused by aging or having the appropriate environmental conditions for a specific execution. The reliability question has sparked interest in using monitors to detect aging specific mechanisms.
“Silicon aging is a huge challenge,” said proteanTecs’ Abramsohn. “We see increasing evidence of faster and more widespread effects of aging in the field, resulting in performance issues and SDCs. The ability to determine the root cause of these issues depends on the ability to localize where the aging is faster and why. We need to be able to measure it and create a database that helps us pinpoint the mechanisms, and then study the patterns to identify where most of the issues are coming from.”
Numerous companies offer on-die monitors that specifically measure transistor properties associated with wear-out. Typically separate from functional circuitry, designers can spatially distribute these monitors across large die. In the field, periodic logging of their measurements can provide longitudinal data about variation in aging.
“We have an aging sensor that measures all the transistor reliability mechanisms (e.g., NBTI, HCI),” said PDF Solutions’ Strojwas. “It’s a small circuit, 50 x 50 microns, that we can put in the die. It has its own voltage regulator, so we can do a local stress of just the sensor, separate from the rest of the circuitry. You can increase the voltage from 0.7 to 1.2 to 1.5 volts to do the accelerated measurements while the device is operating in the field. If there is anything that’s happening in terms of aging, these sensors will provide very precise information.”
Conclusion
While all of these insights into accelerated mechanisms for SDEs are useful, having a timestamp that corresponds to faulty system behavior is still required.
The CPU SDEs/CEEs reported by hyperscalers heighten engineering teams’ interest in the value of internal device data. As proteanTecs’ Abramsohn summed it up, “SDC is a symptom, not a cause. The urgent need is to understand the root causes, but that requires more visibility in areas that are currently obscure.”
Several changes are needed. SoC design engineering teams need to intelligently embed on-die monitors to provide insight into path timing margin, local voltage and temperature conditions, and aging. Secondly, the data logging infrastructure needs to be put in place to enable connectivity to localized analytics and external connectivity to manufacturing testers, data center systems and cloud platforms. Finally, engineers absolutely require time-stamped failure and telemetry data and to accurately perform diagnosis.
References
- H. Hochschild, et al, “Cores That Don’t Count,” Proc. 18th Workshop on Hot syllabus in Operating Systems (HotOS), 2021.
- D. Dixit, et al, “Silent Data Corruption at Scale,” Feb. 2021.
- Ryan, et al, “Process Defect Trends and Strategic Test Gaps,”, International Test Conference, 2014.
Related Stories
Screening For Silent Data Errors
More SDEs can be found using targeted electrical tests and 100% inspection, but not all of them.
Why Silent Data Errors Are So Hard To Find
Subtle IC defects in data center CPUs result in computation errors.
Exams for admission to government and private medical colleges will be held on Mar 10, the head of the Directorate General of Medical Education or DGME has said.
The tests will continue from 10am to 11am, said Dr Abul Bashar Md Jamal, director general of DGME.
“We’ll publish the notice for the exams by Friday or Saturday. The number of seats and admission process will be the same as last year,” he told bdnews24.com on Wednesday after the government published the results of the Higher Secondary Certificate or HSC tests.
Students with a combined GPA of 9 in the Secondary School Certificate or SSC and HSC exams will be eligible to take the entrance tests.
The admission will be made centrally, Dr Abul Bashar said.
Bangladesh has 37 government medical colleges with 4,350 seats. The 72 private medical colleges in the country have 6,489 seats.
As many as 139,742 students took the admission tests last year, meaning there were 13 candidates for each seat.
Tuesday, February 14, 2023
On January 31, 2023, the U.S. Food and Drug Administration (FDA) published a Warning Letter[1] to RightEye, LLC (RightEye), the manufacturer of the RightEye Vision System, for misbranding and adulteration. The RightEye Vision System is a Class II Nystagmograph medical device which is cleared under its 510(k) notification for the following indication: “recording, viewing, and analyzing eye movements in support of identifying visual tracking impairment in human subjects.”[2]
The violations were observed during an FDA inspection on June 28-July 8, 2022 on the Form FDA 483. RightEye responded on July 29, 2022, and FDA concluded the responses were inadequate. In the Warning Letter, FDA wrote that, for the reasons discussed below, the device was: (i) misbranded due to promotion beyond its cleared indications for use, (ii) misbranded due to a failure or refusal to furnish required material and information, and (iii) adulterated due to a failure to conform with medical device good manufacturing practice (GMP) requirements.
Misbranding: Promotion of Off-Label Indications
FDA stated that the RightEye Vision System was misbranded under the Federal, Food, Drug and Cosmetic Act (FDCA) because RightEye introduced the device into interstate commerce with major changes or modifications to the intended use without submitting the requisite new premarket notification to FDA.[3] RightEye’s promotion of the RightEye Vision System implied that the device was intended to Strengthen vision problems and measure and analyze eye movements for “neurological disorders” generally, including ADHD, mTBI (mild traumatic brain injury), and Parkinson’s disease. This promotion constituted a major change from its intended use, stated above, without FDA clearance or approval. For example, RightEye made the following statements:
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“Uncover & Strengthen Vision Problems That Interfere With memorizing and Learning”
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“One in four children has a vision problem that affects learning—a vision problem that is often misinterpreted as disinterest, sleepiness, dyslexia, or ADHD. But in just a few minutes the RightEye™ system exposes vision and brain health in ways not possible from standard eye tests, gifting you with the opportunity to change your child’s life forever.”
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“RightEye EyeQ tests help health care providers assess patients’ brain health, visual dysfunction, concussions, memorizing disorders, and athletic performance issues by following an evidence-based, metrics-driven methodology.”
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“Research has demonstrated that patients with Parkinson’s disease exhibit persistent ocular tremors that prevent stability during fixation. Through oculomotor testing, the RightEye Vision System is designed to identify these ocular tremors, which may not only support doctors in diagnosing of the disease but may also help detect the disease at an earlier stage since ocular tremors are often detectable well before other commonly recognized symptoms of the disease surface.”
FDA noted that such statements posed safety concerns as they could interfere with and delay the traditional standard of care treatment. Specifically, FDA explained that the promotion could prevent patients from seeking appropriate and timely treatment modalities approved by FDA for the indicated treatment.
FDA had not evaluated whether the device could detect vision abnormalities specific to ADHD, mTBI or Parkinson’s disease nor had the device been cleared to aid in the assessment or diagnosis of those conditions. FDA emphasized off-label use to aid in the diagnosis of non-indicated disorders can result in misdiagnosis, delay in diagnosis, delayed treatment or care, and serious secondary injuries. For example, off-label use to diagnose ADHD, mTBI or Parkinson’s disease could result in misdiagnosis or a delay in diagnosis. In the cases of ADHD and Parkinson’s disease, this may result in delayed treatment or care. In the case of mTBI, a second mTBI, which is often fatal, may occur if the initial injury is misdiagnosed or undiagnosed. FDA found RightEye had not provided any plans to implement specific corrective actions regarding off-label promotion of its device beyond its cleared indications for use.
Misbranding: Failure to Submit Information
Under the implementing regulations of the FDCA, “labelers” of a device must submit certain information for unique device identification to FDA’s Global Unique Device Identification Database for each version or model required to bear a Unique Device Identifier.[4] FDA found RightEye had not submitted any required information nor had it indicated any plans to implement specific corrective actions regarding its product labels/labeling.
Adulteration
FDA wrote the RightEye Vision System was adulterated for multiple reasons. First, RightEye did not have an approved application for premarket approval or an approved application for investigational device exemption for the RightEye Vision System.[5] Second, the methods, facilities or controls used for the manufacture, storage, packing or installation of the RightEye Vision System failed to meet GMP requirements on multiple counts.[6] Those violations included:
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Failure to establish and maintain procedures to control the design of the device to ensure that specified design requirements are met. Specifically, no written design control procedures.
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Failure to establish and maintain a design history file (DHF) that contains or references the records necessary to demonstrate that the design was developed in accordance with the approved design plan and design control requirements. Specifically, the DHE for the RightEye Vision System device does not include nor reference the location of supporting design documentation.
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Failure to establish and maintain procedures for receiving, reviewing, and evaluating complaints. Specifically, the complaint handling procedures do not address that all complaints be evaluated to determine whether complaint is required to be reported or that all complaints be evaluated to determine whether an investigation is necessary.
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Failure to establish and maintain procedures to control non-conforming product. Specifically, no procedures concerning the control of nonconforming product were established.
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Failure to establish or maintain the requirements, including quality requirements, that must be met by suppliers, contractors, and consultants. Critical hardware of the device is manufactured by contracted suppliers.
FDA determined RightEye had not demonstrated any plans to implement specific corrective actions.
Additional Considerations
The Warning Letter indicated that a failure to address the noted violations could have serious and varying consequences. Failure to adequately address the notice could result in regulatory action, including seizure, injunction and civil monetary penalties. Non-compliance with the FDCA could impact the award of federal contracts and grant of Certificates to Foreign Governments. FDA’s determination of Quality System violations related to Class III device premarket approval applications could delay the approval of such devices.
FOOTNOTES
[1] Untitled letter available here: https://www.fda.gov/inspections-compliance-enforcement-and-criminal-inve....
[2] K181771 Indications for Use available here: https://www.accessdata.fda.gov/cdrh_docs/pdf18/K181771.pdf.
[3] See 21 U.S.C. § 352(o), 21 U.S.C. § 360(k), 21 CFR 807.81(a)(3)(ii).
[4] See 21 U.S.C. § 352(t)(2), 21 U.S.C. § 360i, 21 CFR 830.
[5] See 21 U.S.C. § 351(f)(1)(B).
[6] See 21 CFR 820.
Copyright © 2023, Sheppard Mullin Richter & Hampton LLP.National Law Review, Volume XIII, Number 45
Electronic Load Devices Market
Electronic Load Devices Market Expected to Reach $5.2 Billion by 2031
PORTLAND, OREGON, UNITED STATES, February 9, 2023 /einpresswire.com / -- The electronic load devices market size was valued at $3.1 billion in 2021, and the electronic load devices industry is estimated to reach $5.2 billion by 2031, growing at a CAGR of 5.4% from 2022 to 2031. An electronic load is a test instrument designed to sink current and absorb power from a power source. Power supplies and electronic loads are complementary test equipment. The power supply tests electronic circuits under specific sourcing conditions. The surge in the development of electronic adoption across the world has led to market growth. The revolution in various fields such as aerospace, defense, government services, automotive, energy, and wireless communication & infrastructure has led to industrialization and urbanization, which have a positive impact on the demand for electronic equipment and electric supply reliability. The instrument used to test AC and DC electronic and electric current is expected to have huge demand during the forecast period.
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The presence of adoption of electronics in various industries such as oil & gas, automobiles, renewable energy, wireless communications and infrastructure, and many other sectors to Strengthen the efficiency in regards to utilization of power without loss. The rising utilization of consumer electronics in the past few years in developing countries such as India and China have led to an increase in the demand for electronic load devices for testing purpose. The increase in awareness among people toward the environment has led to the utilization of alternative power sources in the automotive industry and the utilization of green energy. The presence of a surge in the EV industry after the pandemic has led to an increase in the utilization of battery packs which led to the demand for battery testing equipment. The increase in the investment of the government in renewable energy such as solar and wind have led to increasing in the demand for DC electronic load devices. Furthermore, electrification in developing countries has led to investment in the transmission line and power grid, which led to increased demand for AC electronic load devices market growth during the forecast period.
The electronic load devices market forecast is segmented on the basis of type, voltage, current type, application, and region.
On the basis of type, it is segmented into standalone, modular, and mainframe. On the basis of voltage, the market is divided into low, medium, and high. On the basis of the current type, the market is bifurcated into AC and DC. On the basis of application, the electronic load device market is fragmented into aerospace, defense & government services, automotive, energy, wireless communication & infrastructure, and others.
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Region-wise, the market is studied across North America, Europe, Asia-Pacific, and LAMEA. Presently, North America accounts for the largest electronic load devices market share, followed by Asia-Pacific, and Europe.
The major companies profiled in this report include AMETEK, Ainuo Instrument CO., Ltd, B&K Precision Corporation, Chroma ATE, Chroma Systems Solutions Inc., FDK Corporation, General Electric, Good Will Instrument Co., Itech Electronic Co. Ltd, Keysight Technologies, Kikusui Electronics Corporation, Matsudada Precision, National Instrument, NFCorp, TDK-Lambda Corporation, Tektronix, and Teledyne Technologies. Owing to the increase in the utilization of wireless technology in consumer electronics and the surge in the employment of batteries in portable electronic gadgets have led to the demand for various testing equipment to avoid accidents. Additional growth strategies such as the expansion of production capacities, acquisition, partnership, and research & innovation in detection technologies have led to attaining key developments in the global electronic load devices market trends.
Key findings of the study
- North America would exhibit a CAGR of 4.9% during 2022-2031.
- As per global electronic load devices market analysis, by type, the modular segment accounted for the largest share in 2021.
- By voltage, the low was the leading segment in 2021.
- By current type, the DC segment has the largest market share in 2021.
- By application, wireless communication & infrastructure has the largest market share in 2021.
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Impact of Covid-19 on the Global Electronic Load Devices Market
- The global COVID-19 pandemic has negative impact on the electronic load devices market. This market has experienced lower-than-anticipated demand across all regions compared to pre-pandemic levels. The global market exhibited a decline of about 20% in 2020 compared to 2019.
- COVID-19 negatively impacted the electronic load devices market as it led to a decline in sales turnover. Owing to stringent lockdown restrictions, manufacturing activity got severely affected, which hampered the market growth and profitability. However, during the forecast period, the market is expected to recover due to eased lockdown restrictions in most nations. Furthermore, the major manufacturing giants have launched various products related to consumer electronics which will lead to a surge in the electronic load devices market opportunities after the pandemic.
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Dhaka, Feb. 8 -- Public universities will hold admission tests for 2022-2023 session on short syllabus, hopes Education Minister Dr. Dipu Moni.
"We discussed the matter with the vice-chancellors recently. We requested that they take this year's admission tests based on revised syllabus of HSC examination," she told reporters after announcing HSC results at International Mother Language Institute in Dhaka.
"We are hoping that all universities will implement this," she said.
"Each university used to take admission test separately earlier. Many of them now held the examination under a uniform procedure," she added.
Results of 2022 Higher Secondary Certificate (HSC) and equivalent examinations were published today. The average pass percentage is 85.95 percent.
A total of 10,11, 987 examinees, out of 11,77, 387, passed the 2022 exams under 11 education boards of the country. The number was 13,06,718 in 2021.
Published by HT Digital Content Services with permission from United News of Bangladesh.
